On Tue, Jul 9, 2024 at 8:44 AM Shin'ichiro Kawasaki <shinichiro.kawasaki@xxxxxxx> wrote: > > The test case dm/002 rarely fails with the message below: > > dm/002 => nvme0n1 (dm-dust general functionality test) [failed] > runtime 0.204s ... 0.174s > --- tests/dm/002.out 2024-06-14 14:37:40.480794693 +0900 > +++ /home/shin/Blktests/blktests/results/nvme0n1/dm/002.out.bad 2024-06-14 21:38:18.588976499 +0900 > @@ -7,4 +7,6 @@ > countbadblocks: 0 badblock(s) found > countbadblocks: 3 badblock(s) found > countbadblocks: 0 badblock(s) found > +device-mapper: remove ioctl on dust1 failed: Device or resource busy > +Command failed. > Test complete > modprobe: FATAL: Module dm_dust is in use. > > This failure happens at "dmsetup remove" command, when the previous > operation on the dm device is still ongoing. In this case, > dm_open_count() is non-zero, then IOCTL for device remove fails and > EBUSY is returned. > > To avoid the failure, retry the "dmsetup remove" command when it fails > with EBUSY. Introduce the helper function _dm_remove for this purpose. > > Signed-off-by: Shin'ichiro Kawasaki <shinichiro.kawasaki@xxxxxxx> I think this looks good, and I tested it on my system: Reviewed-by: Bryan Gurney <bgurney@xxxxxxxxxx> I want to cc dm-devel and the device-mapper maintainers, in case there are any questions on this test. (It's probably a good idea to cc dm-devel for any "dm" blktests.) Thanks, Bryan
