Hello, this patch set fixes several different races and issues I've found when testing device shutdown and reuse. The first three patches and fixes to problems in my previous series fixing BDI lifetime issues. Patch 4 fixes issues with reuse of BDI name with scsi devices. With it I cannot reproduce the BDI name reuse issues using Omar's stress test using scsi_debug so it can be used as a replacement of Dan's patches. Patches 5-8 fix oops that is triggered by __blkdev_put() calling inode_detach_wb() too early (the problem reported by Thiago). Patches 9 and 10 fix oops due to a bug in gendisk code where get_gendisk() can return already freed gendisk structure (again triggered by Omar's stress test). People, please have a look at patches. The are mostly simple however the interactions are rather complex so I may have missed something. Also I'm happy for any additional testing these patches can get - I've stressed them with Omar's script, tested memcg writeback, tested static (not udev managed) device inodes. Honza
