* v4:
1. Added patch to make other ECC configurations function static.
2. Clubbed the DT update patches.
3. Removed the bad block related patch. Discussion is going on
related with for proper solution so planning to submit separate
patch series for all bad block related changes.
4. Made the single codeword raw read function and used the same
for raw page read.
5. Changes in erased codeword detection to raw read function.
* v3:
1. Addressed all review comments in v2.
2. Added patch for removing redundant nand-ecc-step-size DT property.
3. Renamed ECC configuration setup function with minor code changes.
4. Modified comments and commit message for few patches.
* v2:
1. Addressed all review comments in v1.
1. Make the generic helper function for NAND ECC parameters setup
and used this helper function for QCOM and Denali nand driver
for ECC setup.
2. Modified commit message for some of the patches and added more
comments.
3. Added new patch for fixing ‘return 0’ for raw read.
4. Removed the read last codeword part for nand oob write.
5. Reorganized bad block check function and removed the
read_last_cw function completely.
* v1:
This patch series mainly deals with error handling and erased page
bitflip detection for QCOM NAND driver.
1. The error handling was missing for some of the cases so fixed
the same.
2. Add the support for taking ECC strength from ONFI parameter.
The earlier QCOM boards were coming with 4-bit ECC chip but
now the same boards are coming with 8-bit ECC chip since the
earlier 4-bit parts are obsolete from some vendors.
3. We got few issues related with NAND erased page bitflips. The
QCOM NAND controller can’t detect the bitflip in completely erased
page so added the support to detect the same. It implemented the
logic mentioned in patch [1] which didn’t go in mainline and later
the generic functions were provided [2] to count the number of
bitflips and make all 0xff. This patch series did some optimization
logic to prevent the unnecessary full page raw read and data copy
from QCOM NAND controller to DMA.
4. Following are the testing done for these patches in QCOM IPQ8074
HK01 (4-bit and 8-bit ECC chip) and IPQ806x AP148 boards.
a. Run all mtd test and check if it passes
b. Introduce custom bitflips in erased page and check if it
returns no error/EUCLEAN/EBADMSG depending upon number of
bitflips and position.
c. Introduce failure condition for operational failure and
check if it detects the same.
[1]: https://patchwork.ozlabs.org/patch/328994/
[2]: https://patchwork.ozlabs.org/patch/509970/
Abhishek Sahu (15):
mtd: rawnand: helper function for setting up ECC configuration
mtd: rawnand: denali: use helper function for ecc setup
dt-bindings: qcom_nandc: update for ECC strength and step size
mtd: rawnand: qcom: remove dt property nand-ecc-step-size
mtd: rawnand: qcom: use the ecc strength from device parameter
mtd: rawnand: qcom: wait for desc completion in all BAM channels
mtd: rawnand: qcom: erased page detection for uncorrectable errors
only
mtd: rawnand: qcom: fix null pointer access for erased page detection
mtd: rawnand: qcom: parse read errors for read oob also
mtd: rawnand: qcom: modify write_oob to remove read codeword part
mtd: rawnand: qcom: fix return value for raw page read
mtd: rawnand: qcom: check for operation errors in case of raw read
mtd: rawnand: qcom: code reorganization for raw read
mtd: rawnand: qcom: erased page bitflips detection
mtd: rawnand: provide only single helper function for ECC conf
.../devicetree/bindings/mtd/qcom_nandc.txt | 7 +-
drivers/mtd/nand/raw/denali.c | 30 +-
drivers/mtd/nand/raw/nand_base.c | 72 ++-
drivers/mtd/nand/raw/qcom_nandc.c | 491 ++++++++++++++-------
include/linux/mtd/rawnand.h | 10 +-
5 files changed, 380 insertions(+), 230 deletions(-)
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