Re: [kvm-unit-tests PATCH] Support micro operation measurement on arm64

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On Tue, Dec 19, 2017 at 02:07:06PM +0100, Christoffer Dall wrote:
> On Tue, Dec 19, 2017 at 01:11:09PM +0100, Andrew Jones wrote:
> > On Tue, Dec 19, 2017 at 10:06:20AM +0100, Christoffer Dall wrote:
> > > On Mon, Dec 18, 2017 at 03:58:49PM -0500, Shih-Wei Li wrote:
> > > > 
> > > > I have only tested the code by invoking test directly using make
> > > > standalone like the following. I did notice that it took ~90 seconds
> > > > to finish the test itself.
> > > > ./"tests/micro-cost"
> > 
> > standalone still uses timeout with 90 seconds. So your hardware was just
> > faster than mine, I guess :-)
> > 
> 
> [indentation confusion?]

Actually I was just lazily replying to both you and Shih-Wei in the same
mail.

> 
> You're responding to something Shih-Wei wrote here, but I didn't
> understand Shih-Wei's answer, and I think he ran the work on Seattle, so
> not sure what the difference was.

It turns out the problem was just the opposite of what I say above. My
hardware must be faster. While testing v2 of the patch I still got
timeouts, so I decided to actually try to figure out what's going on.
The eoi_test() test is so fast that c1 always equals c2, so we always
assume an overflow occurred and keep trying to get a better sample.

I guess we need two changes to the patch. We need to handle c1 == c2
differently, probably just assume the measurement is smaller than the
timer frequency and report 1 tick instead of zero. We should also
have a way out of loop_test() when the test is constantly returning
zero.

Thanks,
drew



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