[i-g-t PATCH 3/4] flip_test: use monotonic time to measure the test duration

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Subject: [i-g-t PATCH 3/4] flip_test: use monotonic time to measure the test duration
From: daniel at ffwll.ch (Daniel Vetter)
Date: Thu, 22 Nov 2012 14:52:57 +0100
In-reply-to: <1353590706-1366-4-git-send-email-imre.deak@intel.com>
References: <1353590706-1366-1-git-send-email-imre.deak@intel.com> <1353590706-1366-4-git-send-email-imre.deak@intel.com>

On Thu, Nov 22, 2012 at 03:25:05PM +0200, Imre Deak wrote:
> Signed-off-by: Imre Deak <imre.deak at intel.com>

Merged patches 1-3, thanks.
-Daniel
-- 
Daniel Vetter
Software Engineer, Intel Corporation
+41 (0) 79 365 57 48 - http://blog.ffwll.ch

References:
- [i-g-t PATCH 0/4] flip_test: support for monotonic timestamps
  - From: Imre Deak
- [i-g-t PATCH 3/4] flip_test: use monotonic time to measure the test duration
  - From: Imre Deak

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