On Tue, 13 Nov 2012 17:45:14 +0100, Daniel Vetter <daniel at ffwll.ch> wrote: > trying to engineer a perfect test for the > single failure mode we now have in front of us might actually reduce > coverage. This is a critical point worth remembering when writing tests: Having a test case that detects a past bug is great, but a test case that detects a future bug is better. -Chris. -- Chris Wilson, Intel Open Source Technology Centre
