Added the missing IGT_TEST_DESCRIPTION and some subtest descriptions. Signed-off-by: Vinay Belgaumkar <vinay.belgaumkar@xxxxxxxxx> --- tests/gem_flink_basic.c | 36 ++++++++++++++++++++++++++++++++++++ 1 file changed, 36 insertions(+) diff --git a/tests/gem_flink_basic.c b/tests/gem_flink_basic.c index 26ae7d6..8761e0d 100644 --- a/tests/gem_flink_basic.c +++ b/tests/gem_flink_basic.c @@ -36,6 +36,8 @@ #include <sys/ioctl.h> #include "drm.h" +IGT_TEST_DESCRIPTION("Tests for flink - a way to export a gem object by name"); + static void test_flink(int fd) { @@ -155,14 +157,48 @@ igt_main igt_fixture fd = drm_open_driver(DRIVER_INTEL); + /* basic: + This subtest creates a gem object, and then creates + a flink. It tests that we can gain access to the gem + object using the flink name. + + Test fails if flink creation/open fails. + **/ igt_subtest("basic") test_flink(fd); + + /* double-flink: + This test checks if it is possible to create 2 flinks + for the same gem object. + + Test fails if 2 flink objects cannot be created. + **/ igt_subtest("double-flink") test_double_flink(fd); + + /* bad-flink: + Use an invalid flink handle. + + DRM_IOCTL_GEM_FLINK ioctl call should return failure. + **/ igt_subtest("bad-flink") test_bad_flink(fd); + + /* bad-open: + Try to use an invalid flink name. + + DRM_IOCTL_GEM_FLINK ioctl call should return failure. + **/ igt_subtest("bad-open") test_bad_open(fd); + + /* flink-lifetime: + Check if a flink name can be used even after the drm + fd used to create it is closed. + + Flink name should remain valid until the gem object + it points to has not been freed. + **/ igt_subtest("flink-lifetime") test_flink_lifetime(fd); } -- 1.9.1 _______________________________________________ Intel-gfx mailing list Intel-gfx@xxxxxxxxxxxxxxxxxxxxx https://lists.freedesktop.org/mailman/listinfo/intel-gfx