Re: [PATCH] generic: skip dm-log-writes tests on XFS v5 superblock filesystems

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On Wed, Feb 27, 2019 at 12:13:37PM -0500, Brian Foster wrote:
> On Wed, Feb 27, 2019 at 10:54:20AM -0500, Josef Bacik wrote:
> > On Wed, Feb 27, 2019 at 09:17:32AM -0500, Brian Foster wrote:
> > > On Wed, Feb 27, 2019 at 08:18:39AM -0500, Brian Foster wrote:
> > > > On Tue, Feb 26, 2019 at 11:10:02PM +0200, Amir Goldstein wrote:
> > > > > On Tue, Feb 26, 2019 at 8:14 PM Brian Foster <bfoster@xxxxxxxxxx> wrote:
> > > > > >
> > > > > > The dm-log-writes mechanism runs a workload against a filesystem,
> > > > > > tracks underlying FUAs and restores the filesystem to various points
> > > > > > in time based on FUA marks. This allows fstests to check fs
> > > > > > consistency at various points and verify log recovery works as
> > > > > > expected.
> > > > > >
> > > > > 
> > > > > Inaccurate. generic/482 restores to FUA points.
> > > > > generic/45[57] restore to user defined points in time (marks).
> > > > > dm-log-writes mechanism is capable of restoring either.
> > > > > 
> > > > 
> > > > The above is poorly worded. I'm aware of the separate tests and I've
> > > > used the mechanism to bounce around to various marks. Note that my
> > > > understanding of the mechanism beyond that is rudimentary. I'll reword
> > > > this if the patch survives, but it sounds like there may be opportunity
> > > > to fix the mechanism, which clearly would be ideal.
> > > > 
> > > > > > This mechanism does not play well with LSN based log recovery
> > > > > > ordering behavior on XFS v5 superblocks, however. For example,
> > > > > > generic/482 can reproduce false positive corruptions based on extent
> > > > > > to btree conversion of an inode if the inode and associated btree
> > > > > > block are written back after different checkpoints. Even though both
> > > > > > items are logged correctly in the extent-to-btree transaction, the
> > > > > > btree block can be relogged (multiple times) and only written back
> > > > > > once when the filesystem unmounts. If the inode was written back
> > > > > > after the initial conversion, recovery points between that mark and
> > > > > > when the btree block is ultimately written back will show corruption
> > > > > > because log recovery sees that the destination buffer is newer than
> > > > > > the recovered buffer and intentionally skips the buffer. This is a
> > > > > > false positive because the destination buffer was resiliently
> > > > > > written back after being physically relogged one or more times.
> > > > > >
> > > > > 
> > > > > This story doesn't add up.
> > > > > Either dm-log-writes emulated power failure correctly or it doesn't.
> > > > 
> > > > It doesn't. It leaves the log and broader filesystem in a state that
> > > > makes no sense with respect to a power failure.
> > > > 
> > > > > My understanding is that the issue you are seeing is a result of
> > > > > XFS seeing "data from the future" after a restore of a power failure
> > > > > snapshot, because the scratch device is not a clean slate.
> > > > > If I am right, then the correct solution is to wipe the journal before
> > > > > starting to replay restore points.
> > > > > 
> > > > > Am I misunderstanding whats going on?
> > > > > 
> > > > 
> > > > Slightly. Wiping the journal will not help. I _think_ that a wipe of the
> > > > broader filesystem before recovering from the initial fua and replaying
> > > > in order from there would mitigate the problem. Is there an easy way to
> > > > test that theory? For example, would a mkfs of the scratch device before
> > > > the replay sequence of generic/482 begins allow the test to still
> > > > otherwise function correctly?
> > > > 
> > > 
> > > FYI, I gave this a try and it didn't ultimately work because mkfs didn't
> > > clear the device either. I ended up reproducing the problem, physically
> > > zeroing the device, replaying the associated FUA and observing the
> > > problem go away. From there, if I replay to the final FUA mark and go
> > > back to the (originally) problematic FUA, the problem is reintroduced.
> > > 
> > 
> > Sorry guys, whenever I run log-writes on xfs I use my helper script here
> > 
> > https://github.com/josefbacik/log-writes
> > 
> > specifically replay-individual-faster.sh.  This creates a snapshot at every
> > replay point, mounts and checks the fs, and then destroys the snapshot and keeps
> > going.  This way you don't end up with the "new" data still being on the device.
> > It's not super fast, but this is usually a fire and forget sort of thing.  I
> > could probably integrate this into xfstests for our log-writes tests, those tend
> > to not generate large logs so wouldn't take super long.  Does this fix the
> > problem for you Brian?
> > 
> 
> Thanks Josef. At a glance at that script I'm not quite following how
> this fits together. Are you taking a snapshot of the original device
> before the workload being tested is run against dm-log-writes, then
> replaying on top of that? In general, anything that puts the device back
> into the state from before the workload ran and replays from there
> should be enough to fix the problem I think. As long as a replay
> sequence runs in order, I don't think snapshots of each replay point
> should technically be necessary (vs a single replay snapshot, for e.g.).
> 

Well we do this so we can mount/unmount the fs to get the log replay to happen,
and then run fsck.  We want the snapshot so that we can roll back the changes of
the log replay.

> Note that I ended up testing generic/482 with a loop device for a
> scratch device and that also worked around the problem, I suspect
> because that allowed the aforementioned discards to actually reset the
> underlying the device via loop discard->hole punch (which doesn't occur
> with my original, non-loop scratch dev). So it seems that another option
> for more deterministic behavior in fstests could be to just enforce the
> use of a loop device as the underlying target in these particular tests.
> For example, have the log-writes init create a file on the test device
> and loop mount that rather than using the scratch device. Just a thought
> though, it's not clear to me that's any more simple than what you have
> already implemented here..
> 

I'm good either way.  What I've done here isn't simple, it's more meant for my
long running tests.  Doing loop and discarding the whole device would be cool,
but I'm afraid of punch hole bugs in the underlying file system making things
weird, or running on kernels where loop doesn't do punch hole or the fs doesn't
support punch hole.

Each solution has its drawbacks.  Adding a bunch of infrastructure to do
snapshots isn't super awesome, but may be the most flexible.  The loop solution
has the added benefit of also testing punch hole/discard ;).

Josef



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