On Thu, Oct 26, 2017 at 05:44:46PM -0700, Darrick J. Wong wrote: > If the DISCARD of the thin device somehow fails with this message: > > device-mapper: thin: Data device (dm-1) discard unsupported: Disabling discard passdown. > > Then we can end up with arbitrary gunk in the thin device. This causes > mkfs to fail because it's afraid to format the device. Don't be afraid, > just zap it. FWIW mkfs.xfs thinks that the thinp device has an xfs > external log because sometimes the thinp device just happen to be backed > by the log of the previous test's scratch fs. > > Signed-off-by: Darrick J. Wong <darrick.wong@xxxxxxxxxx> > --- > tests/generic/459 | 2 +- > 1 file changed, 1 insertion(+), 1 deletion(-) > > diff --git a/tests/generic/459 b/tests/generic/459 > index 7c10c2a..3dd3681 100755 > --- a/tests/generic/459 > +++ b/tests/generic/459 > @@ -92,7 +92,7 @@ $LVM_PROG lvcreate --virtualsize $virtsize \ > -T $vgname/$poolname \ > -n $lvname >>$seqres.full 2>&1 > > -_mkfs_dev /dev/mapper/$vgname-$lvname >>$seqres.full 2>&1 > +_mkfs_dev -f /dev/mapper/$vgname-$lvname >>$seqres.full 2>&1 I think we should fix it in _mkfs_dev, add a new switch entry for xfs. Thanks, Eryu > > > # Running the test over the original volume doesn't reproduce the problem -- To unsubscribe from this list: send the line "unsubscribe fstests" in the body of a message to majordomo@xxxxxxxxxxxxxxx More majordomo info at http://vger.kernel.org/majordomo-info.html
