Most likely user would replace or delete the device when there is a problem with the device. We want to test this condition by using the dm error target which will help to create the EIO when needed. Basically first create the linear device and then load the error table to get the EIO when needed. The fist patch will provide the helper dm functions to create such a test case using dm error device. 2nd and 3rd patch uses it to test the device replace and delete, respectively. Note that device delete will need kernel and progs patch, which when not there tests will gracefully fail and will not run respectively. v3->v4: rebase on latest xfstests code v2->v3: accepts Filipe Manana's review comments, thanks. v1->v2: accepts Dave Chinner's review comments, thanks. Anand Jain (3): xfstests: btrfs: add functions to create dm-error device xfstests: btrfs: test device replace, with EIO on the src dev xfstests: btrfs: test device delete with EIO on src dev common/dmerror | 69 +++++++++++++++++++++++++++++++++++++++++++++++ common/rc | 21 +++++++++++++++ tests/btrfs/095 | 76 ++++++++++++++++++++++++++++++++++++++++++++++++++++ tests/btrfs/095.out | 10 +++++++ tests/btrfs/096 | 77 +++++++++++++++++++++++++++++++++++++++++++++++++++++ tests/btrfs/096.out | 10 +++++++ tests/btrfs/group | 2 ++ 7 files changed, 265 insertions(+) create mode 100644 common/dmerror create mode 100755 tests/btrfs/095 create mode 100644 tests/btrfs/095.out create mode 100755 tests/btrfs/096 create mode 100644 tests/btrfs/096.out -- 2.4.1 -- To unsubscribe from this list: send the line "unsubscribe fstests" in the body of a message to majordomo@xxxxxxxxxxxxxxx More majordomo info at http://vger.kernel.org/majordomo-info.html
