This job file shows how one can write sequentially to an MTD device, erase (with trim), and do a looped write/trim workload. Ignoring EIO errors allows operations to continue as bad blocks are skipped. The block histogram counts P/E cycles and can be used to assess NAND flash lifetime and failure characteristics. This job file is written to work with the nandsim fake NAND device. Signed-off-by: Dan Ehrenberg <dehrenberg@xxxxxxxxxxxx> --- examples/mtd.fio | 21 +++++++++++++++++++++ 1 file changed, 21 insertions(+) create mode 100644 examples/mtd.fio diff --git a/examples/mtd.fio b/examples/mtd.fio new file mode 100644 index 0000000..e5dcea4 --- /dev/null +++ b/examples/mtd.fio @@ -0,0 +1,21 @@ +[global] +gtod_reduce=1 +filename=/dev/mtd0 +ioengine=mtd +ignore_error=,EIO +blocksize=512,512,16384 +skip_bad=1 + +[write] +stonewall +rw=trim + +[write] +stonewall +rw=write + +[write] +stonewall +block_error_percentiles=1 +rw=trimwrite +loops=4 -- 2.2.0.rc0.207.ga3a616c -- To unsubscribe from this list: send the line "unsubscribe fio" in the body of a message to majordomo@xxxxxxxxxxxxxxx More majordomo info at http://vger.kernel.org/majordomo-info.html
