Hey all,
Attached is a bunch of messages I'm receiving from smartd about
prefailure attribute and usage
attribute for both of my internal drives. I'm wondering if these
drives are both dying, or if smartd
is misbehaving. I'm not really familiar with smart, so any clues
would be helpful.
Anyone else seeing excessive messages out of smartd?
rawhide
kernel-2.6.25-0.82.rc3.git2.fc9.i686
smartmontools-5.37-8.5.fc9.i386
--
Andrew Farris <lordmorgul@xxxxxxxxx> www.lordmorgul.net
gpg 0xC99B1DF3 fingerprint CDEC 6FAD BA27 40DF 707E A2E0 F0F6 E622 C99B 1DF3
No one now has, and no one will ever again get, the big picture. - Daniel Geer
----
----
> grep SMART /var/log/messages
Mar 4 01:47:44 cirithungol smartd[2825]: Device: /dev/sdc, Bad IEC (SMART) mode page, err=5, skip device
Mar 4 01:47:44 cirithungol smartd[2825]: Device: /dev/sdd, Bad IEC (SMART) mode page, err=5, skip device
Mar 4 01:47:44 cirithungol smartd[2825]: Device: /dev/sda, is SMART capable. Adding to "monitor" list.
Mar 4 01:47:44 cirithungol smartd[2825]: Device: /dev/sdb, is SMART capable. Adding to "monitor" list.
Mar 4 01:47:44 cirithungol smartd[2825]: Device: /dev/sdc, ATA IDENTIFY DEVICE words 82-83 don't specify if SMART capable.
Mar 4 02:27:14 cirithungol smartd[2415]: Device: /dev/sda, is SMART capable. Adding to "monitor" list.
Mar 4 02:27:14 cirithungol smartd[2415]: Device: /dev/sdb, is SMART capable. Adding to "monitor" list.
Mar 4 02:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 4 02:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar 4 02:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 4 02:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 68
Mar 4 02:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 68
Mar 4 03:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar 4 03:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar 4 03:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar 4 03:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar 4 03:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 4 03:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar 4 03:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 4 03:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar 4 04:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75
Mar 4 04:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75
Mar 4 04:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 68 to 66
Mar 4 04:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar 4 04:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 68 to 66
Mar 4 05:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 76
Mar 4 05:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 76
Mar 4 05:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar 4 06:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 76 to 73
Mar 4 06:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 76 to 73
Mar 4 06:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 4 06:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 4 07:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar 4 07:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar 4 08:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 4 08:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 4 08:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67
Mar 4 08:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67
Mar 4 08:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar 4 08:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66
Mar 4 08:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66
Mar 4 09:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar 4 09:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar 4 10:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 4 10:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 4 10:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67
Mar 4 10:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67
Mar 4 10:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar 4 10:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar 4 10:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66
Mar 4 10:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar 4 10:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66
Mar 4 11:27:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 4 11:27:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 4 12:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75
Mar 4 12:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 41
Mar 4 12:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75
Mar 4 12:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67
Mar 4 12:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67
Mar 4 13:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 73
Mar 4 13:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 42
Mar 4 13:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 73
Mar 4 13:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66
Mar 4 13:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66
Mar 4 13:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 4 13:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 42 to 41
Mar 4 13:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 4 13:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 41
Mar 4 14:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar 4 14:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar 4 14:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 40
Mar 4 15:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 4 15:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 42
Mar 4 15:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 4 15:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75
Mar 4 15:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 42 to 41
Mar 4 15:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75
Mar 4 16:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 74
Mar 4 16:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 74
Mar 4 16:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar 4 16:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 39
Mar 4 16:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar 4 16:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 38
Mar 4 17:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 4 17:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 37
Mar 4 17:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 4 17:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 38 to 37
Mar 4 17:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar 4 17:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar 4 17:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 37 to 36
Mar 4 18:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 4 18:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 37 to 39
Mar 4 18:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 4 18:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 36 to 38
Mar 4 18:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar 4 18:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67
Mar 4 18:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 38 to 39
Mar 4 18:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67
Mar 4 19:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75
Mar 4 19:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75
Mar 4 19:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar 4 19:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 74
Mar 4 19:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 74
Mar 4 20:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 72
Mar 4 20:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 72
Mar 4 20:27:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66
Mar 4 20:27:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66
Mar 4 20:51:28 cirithungol smartd[2838]: Device: /dev/sdc, Bad IEC (SMART) mode page, err=5, skip device
Mar 4 20:51:28 cirithungol smartd[2838]: Device: /dev/sdd, Bad IEC (SMART) mode page, err=5, skip device
Mar 4 20:51:28 cirithungol smartd[2838]: Device: /dev/sda, is SMART capable. Adding to "monitor" list.
Mar 4 20:51:28 cirithungol smartd[2838]: Device: /dev/sdb, is SMART capable. Adding to "monitor" list.
Mar 4 20:51:28 cirithungol smartd[2838]: Device: /dev/sdc, ATA IDENTIFY DEVICE words 82-83 don't specify if SMART capable.
Mar 4 21:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66
Mar 4 21:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 40
Mar 4 21:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66
Mar 4 21:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 4 21:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 4 22:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar 4 22:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar 4 22:51:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 4 22:51:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 5 00:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar 5 00:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar 5 00:51:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67
Mar 5 00:51:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar 5 00:51:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67
Mar 5 01:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar 5 01:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 5 01:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 5 02:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 68
Mar 5 02:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 68
Mar 5 02:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar 5 03:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 72
Mar 5 03:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 72
Mar 5 03:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar 5 03:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 72 to 73
Mar 5 03:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 72 to 73
Mar 5 03:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar 5 04:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 72
Mar 5 04:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar 5 04:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 72
Mar 5 04:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 68 to 67
Mar 5 04:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 68 to 67
Mar 5 04:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 72 to 74
Mar 5 04:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar 5 04:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 72 to 74
Mar 5 04:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 68
Mar 5 04:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 68
Mar 5 05:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar 5 05:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 38
Mar 5 05:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar 5 05:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar 5 05:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 68 to 67
Mar 5 05:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 68 to 67
Mar 5 06:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 5 06:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 5 07:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar 5 07:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar 5 08:21:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar 5 08:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 38 to 39
Mar 5 09:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar 5 09:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar 5 09:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar 5 09:51:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar 5 10:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar 5 11:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66
Mar 5 11:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66
Mar 5 12:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75
Mar 5 12:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75
Mar 5 12:51:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 73
Mar 5 12:51:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 73
> smartctl --all /dev/sda
smartctl version 5.37 [i386-redhat-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda ATA IV family
Device Model: ST340016A
Serial Number: 3HS5967V
Firmware Version: 3.75
User Capacity: 40,020,664,320 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 5
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Wed Mar 5 13:52:26 2008 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 421) seconds.
Offline data collection
capabilities: (0x1b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 31) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 073 061 034 Pre-fail Always - 178337265
3 Spin_Up_Time 0x0003 092 087 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 103
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 078 060 030 Pre-fail Always - 66563212
9 Power_On_Hours 0x0032 065 065 000 Old_age Always - 31486
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 099 099 020 Old_age Always - 1979
194 Temperature_Celsius 0x0022 041 051 000 Old_age Always - 41
195 Hardware_ECC_Recovered 0x001a 073 061 000 Old_age Always - 178337265
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 31486 -
# 2 Short captive Completed without error 00% 9407 -
# 3 Extended offline Aborted by host 50% 0 -
Device does not support Selective Self Tests/Logging
> smartctl --all /dev/sdb
smartctl version 5.37 [i386-redhat-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda ATA IV family
Device Model: ST340016A
Serial Number: 3HS54X56
Firmware Version: 3.75
User Capacity: 40,020,664,320 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 5
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Wed Mar 5 13:52:31 2008 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 421) seconds.
Offline data collection
capabilities: (0x1b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 31) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 066 060 034 Pre-fail Always - 154613141
3 Spin_Up_Time 0x0003 091 087 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 885
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 088 060 030 Pre-fail Always - 673763033
9 Power_On_Hours 0x0032 065 065 000 Old_age Always - 30914
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 099 099 020 Old_age Always - 1977
194 Temperature_Celsius 0x0022 040 049 000 Old_age Always - 40
195 Hardware_ECC_Recovered 0x001a 066 060 000 Old_age Always - 154613141
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short captive Completed without error 00% 9363 -
# 2 Extended offline Aborted by host 30% 0 -
Device does not support Selective Self Tests/Logging
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