On Mon, 2005-03-07 at 17:56 -0600, Mike Klinke wrote: > My own experiences with failure have been in a few of the more > popular microcontroller's that have suffered from relatively minor > fluctuating voltage levels that I wouldn't have expected to result > in corrupted data. I'd trust flash in situations where what's > stored there can be rebuilt, say, from ROM, HD, or transferred in > over some type of communications port. I wouldn't trust it "never > to fail", as it just seems to corrupt too often. Powerfail testing on NOR flash devices with JFFS2 showed up a few interesting failure modes which can be worked around, but nothing particularly worrying. However, powerfail testing isn't the same as running the board with 'fluctuating voltage levels'. That sounds like bad board design. If I run my CPU with 'fluctuating voltage levels' I'd expect it to go a little apeshit too :) -- dwmw2
