Re: [PATCH v2 06/21] multipath-tools: add tests for broken VPD page 83

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On Wed, Dec 01, 2021 at 01:36:35PM +0100, mwilck@xxxxxxxx wrote:
> From: Martin Wilck <mwilck@xxxxxxxx>
> 
> Add some tests for the consistency checks in the VPD.
> 
Reviewed-by: Benjamin Marzinski <bmarzins@xxxxxxxxxx>
> Signed-off-by: Martin Wilck <mwilck@xxxxxxxx>
> ---
>  tests/vpd.c | 144 +++++++++++++++++++++++++++++++++++++++++++++++++++-
>  1 file changed, 143 insertions(+), 1 deletion(-)
> 
> diff --git a/tests/vpd.c b/tests/vpd.c
> index 8e730d3..a7d2092 100644
> --- a/tests/vpd.c
> +++ b/tests/vpd.c
> @@ -9,6 +9,7 @@
>  #include <stdint.h>
>  #include <stdlib.h>
>  #include <unistd.h>
> +#include <errno.h>
>  #include <stdarg.h>
>  #include <stddef.h>
>  #include <setjmp.h>
> @@ -291,7 +292,9 @@ static int create_vpd83(unsigned char *buf, size_t bufsiz, const char *id,
>  	unsigned char *desc;
>  	int n = 0;
>  
> -	memset(buf, 0, bufsiz);
> +	/* Fill with large number, which will cause length overflow */
> +	memset(buf, 0xed, bufsiz);
> +	buf[0] = 0;
>  	buf[1] = 0x83;
>  
>  	desc = buf + 4;
> @@ -500,6 +503,27 @@ static void test_vpd_naa_ ## naa ## _ ## wlen(void **state)             \
>  			    test_id, vt->wwid);				\
>  }
>  
> +/**
> + * test_cpd_naa_NAA_badlen_BAD() - test detection of bad length fields
> + * @NAA:	Network Name Authority (2, 3, 5, 16)
> + * @BAD:        Value for designator length field
> + * @ERR:        Expected error code
> + */
> +#define make_test_vpd_naa_badlen(NAA, BAD, ERR)			\
> +static void test_vpd_naa_##NAA##_badlen_##BAD(void **state)	\
> +{								\
> +	struct vpdtest *vt = *state;					\
> +	int n, ret;							\
> +									\
> +	n = create_vpd83(vt->vpdbuf, sizeof(vt->vpdbuf), test_id, 3, NAA, 0); \
> +									\
> +	vt->vpdbuf[7] = BAD;						\
> +	will_return(__wrap_ioctl, n);					\
> +	will_return(__wrap_ioctl, vt->vpdbuf);				\
> +	ret = get_vpd_sgio(10, 0x83, 0, vt->wwid, 40);			\
> +	assert_int_equal(-ret, -ERR);					\
> +}
> +
>  /**
>   * test_vpd_eui_LEN_WLEN() - test code for VPD 83, EUI64
>   * @LEN:	EUI64 length (8, 12, or 16)
> @@ -532,6 +556,31 @@ static void test_vpd_eui_ ## len ## _ ## wlen ## _ ## sml(void **state)	\
>  			    test_id, vt->wwid);				\
>  }
>  
> +/**
> + * test_cpd_eui_LEN_badlen_BAD() - test detection of bad length fields
> + * @NAA:	correct length(8, 12, 16)
> + * @BAD:        value for designator length field
> + * @ERR:        expected error code
> + */
> +#define make_test_vpd_eui_badlen(LEN, BAD, ERR)			\
> +static void test_vpd_eui_badlen_##LEN##_##BAD(void **state)	\
> +{								\
> +	struct vpdtest *vt = *state;					\
> +	int n, ret;							\
> +									\
> +	n = create_vpd83(vt->vpdbuf, sizeof(vt->vpdbuf), test_id, 2, 0, LEN); \
> +									\
> +	vt->vpdbuf[7] = BAD;						\
> +	will_return(__wrap_ioctl, n);					\
> +	will_return(__wrap_ioctl, vt->vpdbuf);				\
> +	ret = get_vpd_sgio(10, 0x83, 0, vt->wwid, 40);			\
> +	assert_int_equal(ret, ERR);					\
> +	if (ERR >= 0)							\
> +		assert_correct_wwid("test_vpd_eui_badlen_"#LEN"_"#BAD,	\
> +			    2 * BAD + 1, ret, '2', 0, true,		\
> +			    test_id, vt->wwid);				\
> +}
> +
>  /**
>   * test_vpd80_SIZE_LEN_WLEN() - test code for VPD 80
>   * @SIZE, @LEN:	see create_vpd80()
> @@ -621,6 +670,17 @@ make_test_vpd_eui(8, 17, 0);
>  make_test_vpd_eui(8, 16, 0);
>  make_test_vpd_eui(8, 10, 0);
>  
> +make_test_vpd_eui_badlen(8, 8, 17);
> +/* Invalid entry, length overflow */
> +make_test_vpd_eui_badlen(8, 12, -EOVERFLOW);
> +make_test_vpd_eui_badlen(8, 9, -EOVERFLOW);
> +/* invalid entry, no length overflow, but no full next entry */
> +make_test_vpd_eui_badlen(8, 7, -EINVAL);
> +make_test_vpd_eui_badlen(8, 5, -EINVAL);
> +/* invalid entry, length of next one readable but too long */
> +make_test_vpd_eui_badlen(8, 4, -EOVERFLOW);
> +make_test_vpd_eui_badlen(8, 0, -EOVERFLOW);
> +
>  /* 96 bit, WWID size: 26 */
>  make_test_vpd_eui(12, 32, 0);
>  make_test_vpd_eui(12, 26, 0);
> @@ -628,12 +688,38 @@ make_test_vpd_eui(12, 25, 0);
>  make_test_vpd_eui(12, 20, 0);
>  make_test_vpd_eui(12, 10, 0);
>  
> +make_test_vpd_eui_badlen(12, 12, 25);
> +make_test_vpd_eui_badlen(12, 16, -EOVERFLOW);
> +make_test_vpd_eui_badlen(12, 13, -EOVERFLOW);
> +/* invalid entry, no length overflow, but no full next entry */
> +make_test_vpd_eui_badlen(12, 11, -EINVAL);
> +make_test_vpd_eui_badlen(12, 9, -EINVAL);
> +/* non-fatal - valid 8-byte descriptor */
> +make_test_vpd_eui_badlen(12, 8, 17);
> +/* invalid entry, length of next one readable but too long */
> +make_test_vpd_eui_badlen(12, 7, -EOVERFLOW);
> +make_test_vpd_eui_badlen(12, 0, -EOVERFLOW);
> +
>  /* 128 bit, WWID size: 34 */
>  make_test_vpd_eui(16, 40, 0);
>  make_test_vpd_eui(16, 34, 0);
>  make_test_vpd_eui(16, 33, 0);
>  make_test_vpd_eui(16, 20, 0);
>  
> +make_test_vpd_eui_badlen(16, 16, 33);
> +make_test_vpd_eui_badlen(16, 17, -EOVERFLOW);
> +make_test_vpd_eui_badlen(16, 15, -EINVAL);
> +make_test_vpd_eui_badlen(16, 13, -EINVAL);
> +/* non-fatal - valid 12-byte descriptor */
> +make_test_vpd_eui_badlen(16, 12, 25);
> +/* invalid entry, length of next one readable but too long */
> +make_test_vpd_eui_badlen(16, 11, -EOVERFLOW);
> +/* non-fatal - valid 8-byte descriptor */
> +make_test_vpd_eui_badlen(16, 8, 17);
> +/* invalid entry, length of next one readable but too long */
> +make_test_vpd_eui_badlen(16, 7, -EOVERFLOW);
> +make_test_vpd_eui_badlen(16, 0, -EOVERFLOW);
> +
>  /* NAA IEEE registered extended (36), WWID size: 34 */
>  make_test_vpd_naa(6, 40);
>  make_test_vpd_naa(6, 34);
> @@ -641,12 +727,33 @@ make_test_vpd_naa(6, 33);
>  make_test_vpd_naa(6, 32);
>  make_test_vpd_naa(6, 20);
>  
> +/* NAA IEEE registered extended with bad designator length */
> +make_test_vpd_naa_badlen(6, 16, 33);
> +/* offset overflow */
> +make_test_vpd_naa_badlen(6, 17, -EOVERFLOW);
> +/* invalid entry, no length overflow, but no full next entry */
> +make_test_vpd_naa_badlen(6, 15, -EINVAL);
> +/* invalid entry, length of next one readable but too long */
> +make_test_vpd_naa_badlen(6, 8, -EOVERFLOW);
> +make_test_vpd_naa_badlen(6, 0, -EOVERFLOW);
> +
>  /* NAA IEEE registered (35), WWID size: 18 */
>  make_test_vpd_naa(5, 20);
>  make_test_vpd_naa(5, 18);
>  make_test_vpd_naa(5, 17);
>  make_test_vpd_naa(5, 16);
>  
> +/* NAA IEEE registered with bad designator length */
> +make_test_vpd_naa_badlen(5, 8, 17);
> +/* offset overflow */
> +make_test_vpd_naa_badlen(5, 16, -EOVERFLOW);
> +make_test_vpd_naa_badlen(5, 9, -EOVERFLOW);
> +/* invalid entry, no length overflow, but no full next entry */
> +make_test_vpd_naa_badlen(5, 7, -EINVAL);
> +/* invalid entry, length of next one readable but too long */
> +make_test_vpd_naa_badlen(5, 4, -EOVERFLOW);
> +make_test_vpd_naa_badlen(5, 0, -EOVERFLOW);
> +
>  /* NAA local (33), WWID size: 18 */
>  make_test_vpd_naa(3, 20);
>  make_test_vpd_naa(3, 18);
> @@ -741,24 +848,59 @@ static int test_vpd(void)
>  		cmocka_unit_test(test_vpd_eui_8_17_0),
>  		cmocka_unit_test(test_vpd_eui_8_16_0),
>  		cmocka_unit_test(test_vpd_eui_8_10_0),
> +		cmocka_unit_test(test_vpd_eui_badlen_8_8),
> +		cmocka_unit_test(test_vpd_eui_badlen_8_12),
> +		cmocka_unit_test(test_vpd_eui_badlen_8_9),
> +		cmocka_unit_test(test_vpd_eui_badlen_8_7),
> +		cmocka_unit_test(test_vpd_eui_badlen_8_5),
> +		cmocka_unit_test(test_vpd_eui_badlen_8_4),
> +		cmocka_unit_test(test_vpd_eui_badlen_8_0),
>  		cmocka_unit_test(test_vpd_eui_12_32_0),
>  		cmocka_unit_test(test_vpd_eui_12_26_0),
>  		cmocka_unit_test(test_vpd_eui_12_25_0),
>  		cmocka_unit_test(test_vpd_eui_12_20_0),
>  		cmocka_unit_test(test_vpd_eui_12_10_0),
> +		cmocka_unit_test(test_vpd_eui_badlen_12_12),
> +		cmocka_unit_test(test_vpd_eui_badlen_12_16),
> +		cmocka_unit_test(test_vpd_eui_badlen_12_13),
> +		cmocka_unit_test(test_vpd_eui_badlen_12_11),
> +		cmocka_unit_test(test_vpd_eui_badlen_12_9),
> +		cmocka_unit_test(test_vpd_eui_badlen_12_8),
> +		cmocka_unit_test(test_vpd_eui_badlen_12_7),
> +		cmocka_unit_test(test_vpd_eui_badlen_12_0),
>  		cmocka_unit_test(test_vpd_eui_16_40_0),
>  		cmocka_unit_test(test_vpd_eui_16_34_0),
>  		cmocka_unit_test(test_vpd_eui_16_33_0),
>  		cmocka_unit_test(test_vpd_eui_16_20_0),
> +		cmocka_unit_test(test_vpd_eui_badlen_16_16),
> +		cmocka_unit_test(test_vpd_eui_badlen_16_17),
> +		cmocka_unit_test(test_vpd_eui_badlen_16_15),
> +		cmocka_unit_test(test_vpd_eui_badlen_16_13),
> +		cmocka_unit_test(test_vpd_eui_badlen_16_12),
> +		cmocka_unit_test(test_vpd_eui_badlen_16_11),
> +		cmocka_unit_test(test_vpd_eui_badlen_16_8),
> +		cmocka_unit_test(test_vpd_eui_badlen_16_7),
> +		cmocka_unit_test(test_vpd_eui_badlen_16_0),
>  		cmocka_unit_test(test_vpd_naa_6_40),
>  		cmocka_unit_test(test_vpd_naa_6_34),
>  		cmocka_unit_test(test_vpd_naa_6_33),
>  		cmocka_unit_test(test_vpd_naa_6_32),
>  		cmocka_unit_test(test_vpd_naa_6_20),
> +		cmocka_unit_test(test_vpd_naa_6_badlen_16),
> +		cmocka_unit_test(test_vpd_naa_6_badlen_15),
> +		cmocka_unit_test(test_vpd_naa_6_badlen_8),
> +		cmocka_unit_test(test_vpd_naa_6_badlen_17),
> +		cmocka_unit_test(test_vpd_naa_6_badlen_0),
>  		cmocka_unit_test(test_vpd_naa_5_20),
>  		cmocka_unit_test(test_vpd_naa_5_18),
>  		cmocka_unit_test(test_vpd_naa_5_17),
>  		cmocka_unit_test(test_vpd_naa_5_16),
> +		cmocka_unit_test(test_vpd_naa_5_badlen_8),
> +		cmocka_unit_test(test_vpd_naa_5_badlen_7),
> +		cmocka_unit_test(test_vpd_naa_5_badlen_4),
> +		cmocka_unit_test(test_vpd_naa_5_badlen_16),
> +		cmocka_unit_test(test_vpd_naa_5_badlen_9),
> +		cmocka_unit_test(test_vpd_naa_5_badlen_0),
>  		cmocka_unit_test(test_vpd_naa_3_20),
>  		cmocka_unit_test(test_vpd_naa_3_18),
>  		cmocka_unit_test(test_vpd_naa_3_17),
> -- 
> 2.33.1

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