From: ChiYuan Huang <cy_huang@xxxxxxxxxxx> Add documentation for the usage of voltage channel integration time. Signed-off-by: ChiYuan Huang <cy_huang@xxxxxxxxxxx> --- Since v8 - Update IIO ABI about sampling frequency for power/current/voltage channel. --- Documentation/ABI/testing/sysfs-bus-iio | 11 +++++++++++ 1 file changed, 11 insertions(+) diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index d4ccc68..17855f7 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -2030,3 +2030,14 @@ Description: Available range for the forced calibration value, expressed as: - a range specified as "[min step max]" + +What: /sys/bus/iio/devices/iio:deviceX/in_voltageX_sampling_frequency +What: /sys/bus/iio/devices/iio:deviceX/in_powerY_sampling_frequency +What: /sys/bus/iio/devices/iio:deviceX/in_currentZ_sampling_frequency +KernelVersion: 5.20 +Contact: linux-iio@xxxxxxxxxxxxxxx +Description: + Some devices have separate controls of sampling frequency for + individual channels. If multiple channels are enabled in a scan, + then the sampling_frequency of the scan may be computed from the + per channel sampling frequencies. -- 2.7.4
