From: ChiYuan Huang <cy_huang@xxxxxxxxxxx> Add documentation for the usage of voltage channel integration time. Signed-off-by: ChiYuan Huang <cy_huang@xxxxxxxxxxx> --- Documentation/ABI/testing/sysfs-bus-iio | 10 ++++++++++ 1 file changed, 10 insertions(+) diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index d4ccc68..1f7d327 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -2030,3 +2030,13 @@ Description: Available range for the forced calibration value, expressed as: - a range specified as "[min step max]" + +What: /sys/bus/iio/devices/iio:deviceX/in_voltageY_integration_time +KernelVersion: 5.20 +Contact: linux-iio@xxxxxxxxxxxxxxx +Description: + For voltage sensing hardware, there may be different time between + channel conversion and sample update. 'Integration time' is used to + specify the channel internal conversion time. And sample update + interval is equal to average sample count multiple integration time. + Unit as microsecond. -- 2.7.4
