We have a board where measurements indicate that the current three options - leaving IO_IMPEDANCE_CTRL at the (factory calibrated) reset value or using one of the two boolean properties to set it to the min/max value - are too coarse. This series adds a device tree binding for an nvmem cell which can be populated during production with a suitable value calibrated for each board, and corresponding support in the driver. The second patch adds a trivial phy wrapper for dev_err_probe(), used in the third. Rasmus Villemoes (3): dt-bindings: dp83867: add binding for io_impedance_ctrl nvmem cell linux/phy.h: add phydev_err_probe() wrapper for dev_err_probe() net: phy: dp83867: implement support for io_impedance_ctrl nvmem cell .../devicetree/bindings/net/ti,dp83867.yaml | 18 +++++- drivers/net/phy/dp83867.c | 55 +++++++++++++++++-- include/linux/phy.h | 3 + 3 files changed, 67 insertions(+), 9 deletions(-) -- 2.31.1
