/* prevents concurrent reads of temperature and ADC */
struct mutex mutex;
struct thermal_zone_device *tzd;
@@ -561,6 +569,9 @@ static int sun4i_gpadc_probe_dt(struct platform_device *pdev,
struct resource *mem;
void __iomem *base;
int ret;
+ struct nvmem_cell *cell;
+ ssize_t cell_size;
+ u64 *cell_data;
info->data = of_device_get_match_data(&pdev->dev);
if (!info->data)
@@ -575,6 +586,39 @@ static int sun4i_gpadc_probe_dt(struct platform_device *pdev,
if (IS_ERR(base))
return PTR_ERR(base);
+ info->has_calibration_data[0] = false;
+ info->has_calibration_data[1] = false;
+
+ if (!info->data->supports_nvmem)
+ goto no_nvmem;
+
+ cell = nvmem_cell_get(&pdev->dev, "calibration");
+ if (IS_ERR(cell)) {
+ if (PTR_ERR(cell) == -EPROBE_DEFER)
+ return PTR_ERR(cell);
+ goto no_nvmem;
goto considered evil ? :)
this was a suggestion from Jonatan in version one, to make the code better
readable.
Isn't
if (info->data->supports_nvmem && IS_ERR(cell = nvmem_cell_get()))
pretty much the same thing?
Maxime
I would say :
if (info->data->supports_nvmem && !IS_ERR(cell = nvmem_cell_get())) is
the same.
This would require an else if statement like this:
else if (info->data->supports_nvmem && PTR_ERR(cell) == -EPROBE_DEFER)
return PTR_ERR(cell);
to avoid errors if the thermal sensor is probed before the sid driver.
Philipp
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