Hi Eduardo,
> On 09-10-2013 02:29, Lukasz Majewski wrote:
> > The commit d0a0ce3e77c795258d47f9163e92d5031d0c5221 ("thermal:
> > exynos: Add missing definations and code cleanup") has removed
> > setting of test MUX address value at TMU configuration setting.
> >
> > This field is not present on Exynos4210 and Exynos5 SoCs. However
> > on Exynos4412 SoC it is required to set this field after reset
> > because without it TMU shows maximal available temperature, which
> > causes immediate platform shutdown.
> >
> > Signed-off-by: Lukasz Majewski <l.majewski@xxxxxxxxxxx>
> > Reviewed-by: Bartlomiej Zolnierkiewicz <b.zolnierkie@xxxxxxxxxxx>
> > Reviewed-by: Tomasz Figa <t.figa@xxxxxxxxxxx>
> >
> > ---
> > Changes for v2:
> > - Define test_mux and test_mux_addr_shift to not use direct
> > register access
> > - Remove pdata->type == SOC_ARCH_EXYNOS4412 check at
> > exynos_tmu_control() and use only generic code
> >
> > drivers/thermal/samsung/exynos_tmu.c | 3 +++
> > drivers/thermal/samsung/exynos_tmu.h | 4 ++++
> > drivers/thermal/samsung/exynos_tmu_data.c | 2 ++
> > drivers/thermal/samsung/exynos_tmu_data.h | 4 ++++
> > 4 files changed, 13 insertions(+)
> >
> > diff --git a/drivers/thermal/samsung/exynos_tmu.c
> > b/drivers/thermal/samsung/exynos_tmu.c index 1312b34..32f38b9 100644
> > --- a/drivers/thermal/samsung/exynos_tmu.c
> > +++ b/drivers/thermal/samsung/exynos_tmu.c
> > @@ -317,6 +317,9 @@ static void exynos_tmu_control(struct
> > platform_device *pdev, bool on)
> > con = readl(data->base + reg->tmu_ctrl);
> >
> > + if (pdata->test_mux)
>
>
> test_mux field is in fact an address, correct? Can 0 be a valid
> address?
No it isn't an address. It is the value which shall be written to
test_mux field of TMU_CONTROL register.
>
> Why not using the feature flags to test for capabilities,
It is easier to assign value to test_mux tmu_data struct, than write
separate set of features for Exynos4412 and Exynos5250, which share the
code.
Also .features seems to define SoC independent features of TMU IP (like
TMU_SUPPORT_EMULATION).
The TEST_MUX setting is platform dependent (only Exynos4412 uses it),
so this is the rationale to define it at tmu platform data.
> features and
> required configurations instead of assuming obscure domain and address
> ranges?
TMU_MUX only uses
(test_mux << test_mux_addr_shift) at tmu_ctrl register.
>
>
> > + con |= (pdata->test_mux <<
> > reg->test_mux_addr_shift); +
> > if (pdata->reference_voltage) {
> > con &= ~(reg->buf_vref_sel_mask <<
> > reg->buf_vref_sel_shift); con |= pdata->reference_voltage <<
> > reg->buf_vref_sel_shift; diff --git
> > a/drivers/thermal/samsung/exynos_tmu.h
> > b/drivers/thermal/samsung/exynos_tmu.h index b42ece4..3fb6554
> > 100644 --- a/drivers/thermal/samsung/exynos_tmu.h +++
> > b/drivers/thermal/samsung/exynos_tmu.h @@ -85,6 +85,7 @@ enum
> > soc_type {
> > * @triminfo_reload_shift: shift of triminfo reload enable bit in
> > triminfo_ctrl reg.
> > * @tmu_ctrl: TMU main controller register.
> > + * @test_mux_addr_shift: shift bits of test mux address.
> > * @buf_vref_sel_shift: shift bits of reference voltage in
> > tmu_ctrl register.
> > * @buf_vref_sel_mask: mask bits of reference voltage in tmu_ctrl
> > register.
> > * @therm_trip_mode_shift: shift bits of tripping mode in tmu_ctrl
> > register. @@ -151,6 +152,7 @@ struct exynos_tmu_registers {
> > u32 triminfo_reload_shift;
> >
> > u32 tmu_ctrl;
> > + u32 test_mux_addr_shift;
> > u32 buf_vref_sel_shift;
> > u32 buf_vref_sel_mask;
> > u32 therm_trip_mode_shift;
> > @@ -258,6 +260,7 @@ struct exynos_tmu_registers {
> > * @first_point_trim: temp value of the first point trimming
> > * @second_point_trim: temp value of the second point trimming
> > * @default_temp_offset: default temperature offset in case of no
> > trimming
> > + * @test_mux; information if SoC supports test MUX
> > * @cal_type: calibration type for temperature
> > * @cal_mode: calibration mode for temperature
> > * @freq_clip_table: Table representing frequency reduction
> > percentage. @@ -287,6 +290,7 @@ struct exynos_tmu_platform_data {
> > u8 first_point_trim;
> > u8 second_point_trim;
> > u8 default_temp_offset;
> > + u8 test_mux;
> >
> > enum calibration_type cal_type;
> > enum calibration_mode cal_mode;
> > diff --git a/drivers/thermal/samsung/exynos_tmu_data.c
> > b/drivers/thermal/samsung/exynos_tmu_data.c index d8de5c1..073c292
> > 100644 --- a/drivers/thermal/samsung/exynos_tmu_data.c
> > +++ b/drivers/thermal/samsung/exynos_tmu_data.c
> > @@ -98,6 +98,7 @@ static const struct exynos_tmu_registers
> > exynos4412_tmu_registers = { .triminfo_ctrl =
> > EXYNOS_TMU_TRIMINFO_CON, .triminfo_reload_shift =
> > EXYNOS_TRIMINFO_RELOAD_SHIFT, .tmu_ctrl = EXYNOS_TMU_REG_CONTROL,
> > + .test_mux_addr_shift = EXYNOS4412_MUX_ADDR_SHIFT,
> > .buf_vref_sel_shift = EXYNOS_TMU_REF_VOLTAGE_SHIFT,
> > .buf_vref_sel_mask = EXYNOS_TMU_REF_VOLTAGE_MASK,
> > .therm_trip_mode_shift = EXYNOS_TMU_TRIP_MODE_SHIFT,
> > @@ -174,6 +175,7 @@ struct exynos_tmu_init_data const
> > exynos4412_default_tmu_data = { {
> > EXYNOS4412_TMU_DATA,
> > .type = SOC_ARCH_EXYNOS4412,
> > + .test_mux = EXYNOS4412_MUX_ADDR_VALUE,
> > },
> > },
> > .tmu_count = 1,
> > diff --git a/drivers/thermal/samsung/exynos_tmu_data.h
> > b/drivers/thermal/samsung/exynos_tmu_data.h index b130b1e..a1ea19d
> > 100644 --- a/drivers/thermal/samsung/exynos_tmu_data.h
> > +++ b/drivers/thermal/samsung/exynos_tmu_data.h
> > @@ -95,6 +95,10 @@
> >
> > #define EXYNOS_MAX_TRIGGER_PER_REG 4
> >
> > +/* Exynos4412 specific */
> > +#define EXYNOS4412_MUX_ADDR_VALUE 6
>
> > +#define EXYNOS4412_MUX_ADDR_SHIFT 20
> > +
> > /*exynos5440 specific registers*/
> > #define EXYNOS5440_TMU_S0_7_TRIM 0x000
> > #define EXYNOS5440_TMU_S0_7_CTRL 0x020
> >
>
>
--
Best regards,
Lukasz Majewski
Samsung R&D Institute Poland (SRPOL) | Linux Platform Group
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