Is there any way to fix the following problems,
like forcing fsck or something?
I am getting smartd errors as reported:
$ cat /var/log/messages
[...]
{repeated messages of the following}
Aug 1 12:33:26 gold smartd[2820]: Device: /dev/sda, 6 Currently
unreadable (pending) sectors
Aug 1 12:33:26 gold smartd[2820]: Device: /dev/sda, 6 Offline
uncorrectable sectors
$ smartctl -a /dev/sda
smartctl version 5.38 [i386-redhat-linux-gnu] Copyright (C) 2002-8 Bruce
Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.10 family
Device Model: ST3750640AS
Serial Number: 5QD3HYLF
Firmware Version: 3.AAE
User Capacity: 750,156,374,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sat Aug 1 12:38:15 2009 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 121) The previous self-test
completed having
the read element of the test failed.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 202) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE
UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 120 094 006 Pre-fail
Always - 236188522
3 Spin_Up_Time 0x0003 095 093 000 Pre-fail
Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age
Always - 164
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail
Always - 0
7 Seek_Error_Rate 0x000f 087 060 030 Pre-fail
Always - 606571888
9 Power_On_Hours 0x0032 092 092 000 Old_age
Always - 7730
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail
Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age
Always - 169
187 Reported_Uncorrect 0x0032 071 071 000 Old_age
Always - 29
189 High_Fly_Writes 0x003a 100 100 000 Old_age
Always - 0
190 Airflow_Temperature_Cel 0x0022 060 052 045 Old_age
Always - 40 (Lifetime Min/Max 33/48)
194 Temperature_Celsius 0x0022 040 048 000 Old_age
Always - 40 (0 24 0 0)
195 Hardware_ECC_Recovered 0x001a 066 063 000 Old_age
Always - 55842978
197 Current_Pending_Sector 0x0012 100 100 000 Old_age
Always - 6
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age
Offline - 6
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age
Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age
Offline - 0
202 TA_Increase_Count 0x0032 100 253 000 Old_age
Always - 0
SMART Error Log Version: 1
ATA Error Count: 30 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 30 occurred at disk power-on lifetime: 7685 hours (320 days + 5 hours)
When the command that caused the error occurred, the device was active
or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 00 5c 9d bf e0 Error: IDNF at LBA = 0x00bf9d5c = 12557660
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 30 4b 9d bf e0 00 00:08:21.882 READ DMA EXT
25 00 08 43 9d bf e0 00 00:08:21.869 READ DMA EXT
25 00 28 8b 95 c0 e0 00 00:08:21.862 READ DMA EXT
25 00 08 83 95 c0 e0 00 00:08:21.856 READ DMA EXT
25 00 08 c3 82 c0 e0 00 00:08:21.957 READ DMA EXT
Error 29 occurred at disk power-on lifetime: 7685 hours (320 days + 5 hours)
When the command that caused the error occurred, the device was active
or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 7a dd bf e0 Error: UNC at LBA = 0x00bfdd7a = 12574074
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 20 63 dd bf e0 00 00:05:00.757 READ DMA EXT
27 00 00 00 00 00 e0 00 00:05:00.685 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 00 00:05:00.683 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 00:05:07.849 SET FEATURES [Set transfer
mode]
27 00 00 00 00 00 e0 00 00:05:07.791 READ NATIVE MAX ADDRESS EXT
Error 28 occurred at disk power-on lifetime: 7685 hours (320 days + 5 hours)
When the command that caused the error occurred, the device was active
or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 7a dd bf e0 Error: UNC at LBA = 0x00bfdd7a = 12574074
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 20 63 dd bf e0 00 00:05:00.757 READ DMA EXT
27 00 00 00 00 00 e0 00 00:05:00.685 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 00 00:05:00.683 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 00:05:00.665 SET FEATURES [Set transfer
mode]
27 00 00 00 00 00 e0 00 00:05:00.609 READ NATIVE MAX ADDRESS EXT
Error 27 occurred at disk power-on lifetime: 7685 hours (320 days + 5 hours)
When the command that caused the error occurred, the device was active
or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 7a dd bf e0 Error: UNC at LBA = 0x00bfdd7a = 12574074
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 20 63 dd bf e0 00 00:05:00.757 READ DMA EXT
27 00 00 00 00 00 e0 00 00:05:00.685 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 00 00:05:00.683 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 00:05:00.665 SET FEATURES [Set transfer
mode]
27 00 00 00 00 00 e0 00 00:05:00.609 READ NATIVE MAX ADDRESS EXT
Error 26 occurred at disk power-on lifetime: 7685 hours (320 days + 5 hours)
When the command that caused the error occurred, the device was active
or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 78 dd bf e0 Error: UNC at LBA = 0x00bfdd78 = 12574072
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 20 63 dd bf e0 00 00:04:56.427 READ DMA EXT
27 00 00 00 00 00 e0 00 00:04:56.371 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 00 00:04:56.368 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 00:04:52.800 SET FEATURES [Set transfer
mode]
27 00 00 00 00 00 e0 00 00:04:52.790 READ NATIVE MAX ADDRESS EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining
LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: read failure 90%
7689 1455414650
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Thanks!
Dan
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